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High-accurate Phase Measurement of specklegram using Images Continuously Captured under Slow Phase-shifting

机译:使用慢相移连续拍摄的图像进行高精度相位测量

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摘要

A new technique which can measure speckle phase with high accuracy is proposed. The technique continuously captures about 100 images under slow phase-shifting and then calculates phase data about each captured image. The calculated phase data are averaged along the capturing order to suppress the noise components due to air fluctuation and vibration of circumstance. Only the average, without other filtering, is not enough to suppress noise which are caused by low modulation data in specklegrams. Therefore, the average is combined with the data replacing which replaces low modulation data with high modulation data around them. The well-known median filter is also combined. With the combined method the fluctuation of phase data is extremely improved. Utility of the combined method is demonstrated through a practical deformation measurement.
机译:提出了一种可以高精度测量散斑相位的新技术。该技术在缓慢的相移下连续捕获约100张图像,然后计算有关每个捕获图像的相位数据。沿捕获顺序对计算出的相位数据进行平均,以抑制由于空气波动和环境振动引起的噪声成分。仅平均值,而没有其他滤波,不足以抑制由散点图中的低调制数据引起的噪声。因此,平均值与数据替换相结合,数据替换将低调制数据替换为周围的高调制数据。还结合了众所周知的中值滤波器。通过组合方法,相位数据的波动得到了极大的改善。通过实际的变形测量​​证明了组合方法的实用性。

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